Blog
Advanced TD-GC-MS Technique to Identify and Control Organic Contamination
Gas Chromatography Mass Spectroscopy (GC-MS) is a powerful analysis technique that is widely used in semiconductor manufacturing to ensure the quality of the materials used in the production process, identify impurities in these materials and provide possible sources...
Our Commitment to Client Relationships
Our commitment to client relationships Samples In - Data Out - Repeat! This is how some analytical labs operate. But at Cerium Labs our scientists aren’t just here to run your tests and send you a report. We want to be part of your team! Beyond giving you the...
Celebrating 30 Years at Cerium Laboratories
We just recently celebrated our 30th anniversary and we could not be more proud of how hard our team has worked and continues to work. You don't make it three decades without being an industry leader, and we take pride in saying that's what we are. We love what we do,...
Cerium’s Team is part of your team!
When we say our team is part of your team, we mean it! The scientists who are part of Cerium's team are always looking for ways to help our clients. Whether we are solving a specific problem, assisting in process improvements, or verifying the quality of a product,...
The History of Cerium Laboratories
We're so proud to announce that at Cerium Laboratories, we have hit 30 years and we're looking forward to many more! Who we are Cerium Laboratories is a global, high growth, analytical services company that provides the highest quality, the quickest response time, and...
Learn More About TEM
Scientists report the size of a SARS-CoV-2 particle to be between 50-140 nm (https://www.news-medical.net/health/The-Size-of-SARS-CoV-2-Compared-to-Other-Things.aspx). New microprocessor technology in devices from companies like Apple, Intel, and AMD produces chips...
6 Steps to Ensure Valid Metals Analysis
Metal contamination in a semiconductor manufacturing environment can greatly reduce wafer yield or create long term product reliability issues. For these reasons’ manufacturers are constantly monitoring their tools for low level metal contamination. Vapor Phase...
VPD-ICPMS vs TXRF
There is a bit of a battle in the analytical arena when it comes to the best method for measuring trace contaminants on the surface of a silicon wafer. We described the analysis of trace metals on silicon wafers by Vapor Phase Decomposition – Inductively Coupled...
Frequently Asked Questions Regarding Vapor Phase Decomposition Inductively Coupled Mass Spectroscopy
You're an expert in your industry, but not the specifics and niche fields of all the science related to it. Nowhere is this more evident than when it comes to Vapor Phase Decomposition Inductively Coupled Mass Spectroscopy. If you've been wanting to learn a little...